SEMI G59 : 1994(R2018)
Current
Current
The latest, up-to-date edition.
TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON LEADFRAME INTERLEAFING AND THE CONTAMINATION TRANSFERRED FROM THE INTERLEAFING TO THE LEADFRAMES
Published date
12-01-2013
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Describes a procedure to determine the ionic contamination on leadframe interleafing and the contamination transferred from the interleafing to the leadframes using a water extraction method. Method is sensitive to the following ionic species: Na+, NH4+, K+, Cl-, NO3-, Br-, (SO4)2-, (PO4)3-.
| DevelopmentNote |
Not available for sale from ILI, customer to contact SEMI. (05/2001)
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| DocumentType |
Standard
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| PublisherName |
Semiconductor Equipment & Materials Institute
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| Status |
Current
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| SEMI G52 : 2015 | TEST METHOD FOR MEASUREMENT OF IONIC CONTAMINATION ON SEMICONDUCTOR LEADFRAMES |
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