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SEMI
SEMI G62 : 2018

SEMI G62 : 2018

Current

Current

The latest, up-to-date edition.

TEST METHOD FOR SILVER PLATING QUALITY

Published date

12-01-2013

Publisher

Semiconductor Equipment & Materials Institute

Specifies procedures to determine silver plating quality.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

SEMI G55 : 1993(R2011) TEST METHOD FOR MEASUREMENT OF SILVER PLATING BRIGHTNESS

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