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SEMI G81.1 : 2007(R2015)

SEMI G81.1 : 2007(R2015)

Current

Current

The latest, up-to-date edition.

SPECIFICATION OF GRAND CONCEPT OF MAP DATA FOR CHARACTERISTICS OF DICE ON SUBSTRATE

Published date

12-01-2013

Publisher

Semiconductor Equipment & Materials Institute

Specifies the data items that relate to electronic substrate mapping.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (02/2007) Not available separately, Published within the SEMI G81 family of standards. (05/2015)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

SEMI T9 : 2010 SPECIFICATION FOR MARKING OF METAL LEAD-FRAME STRIPS WITH A TWO-DIMENSIONAL DATA MATRIX CODE SYMBOL

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