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SEMI M30 : 1997

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

STANDARD TEST METHOD FOR SUBSTITUTIONAL ATOMIC CARBON CONCENTRATION IN GAAS BY FOURIER TRANSFORM INFRARED ABSORPTION SPECTROSCOPY

Withdrawn date

01-03-2009

Published date

12-01-2013

Purpose is to test substitutional atomic carbon concentration in GaAs by Fourier Transform Infrared Absorption Spectroscopy (FT-IR). Referee test procedure covers the determination of substitutional carbon concentration in single crystal GaAs . The helpful range of carbon concentration measurable at room temperature by this test procedure is from the maximum amount of substitutional carbon soluable in GaAs. Standard may involve hazardous equipment, materials and operation. Standard does not purport to address all safety problems associated with its use. The user of this standard has the responsibility to establish appropriate safety and health practices and to determine the applicability of regulatory limitations prior to use.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Withdrawn

SEMI M54 : 2004(R2011) GUIDE FOR SEMI-INSULATING (SI) GAAS MATERIAL PARAMETERS

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