SEMI M83:2020
Current
Current
The latest, up-to-date edition.
Test Method for Determination of Dislocation Etch Pit Density in Monocrystals of III-V Compound Semiconductors
Available format(s)
Hardcopy
Language(s)
English
Published date
01-08-2020
€125.00
Excluding VAT
The purpose of this Document is to specify a test method for determination of the dislocation etch pit density of monocrystals and wafers of the III-V compound semiconductors GaAs, InP and GaP.
| DocumentType |
Test Method
|
| Pages |
0
|
| PublisherName |
Semiconductor Equipment & Materials Institute
|
| Status |
Current
|
| Supersedes |
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