SEMI MF28:2017(R2022)
Current
Current
The latest, up-to-date edition.
Test Method for Minority Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
Available format(s)
Hardcopy
Language(s)
English
Published date
01-06-2022
Important note : Users cannot be edited or removed once added to your Multi user PDF.Minority carrier lifetime is one of the essential characteristics of semiconductor materials. Many metallic impurities form recombination centers in germanium and silicon; in many cases, these recombination centers are deleterious to device and circuit performance.
| DocumentType |
Test Method
|
| Pages |
0
|
| PublisherName |
Semiconductor Equipment & Materials Institute
|
| Status |
Current
|
| Supersedes |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.