SEMI MF397 : 2006(R2011)
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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TEST METHOD FOR RESISTIVITY OF SILICON BARS USING A TWO-POINT PROBE
16-11-2023
12-01-2013
Covers the measurement of the resistivity of single-crystal bars having cross sections that are uniform in area and square, rectangular or round in shape, and having resistivity between 0.0009 and 3000 cm.
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