SEMI MF671:2012(R2023)
Current
Current
The latest, up-to-date edition.
Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials
Available format(s)
Hardcopy
Language(s)
English
Published date
01-10-2023
Important note : Users cannot be edited or removed once added to your Multi user PDF.This Test Method covers techniques for determination of the length of the flatted portion of a wafer periphery.
| DocumentType |
Test Method
|
| Pages |
0
|
| PublisherName |
Semiconductor Equipment & Materials Institute
|
| Status |
Current
|
| Supersedes |
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