SEMI MF728:2022
Current
Current
The latest, up-to-date edition.
Practice for Preparing an Optical Microscope for Dimensional Measurements
Available format(s)
Hardcopy
Language(s)
English
Published date
01-06-2022
Important note : Users cannot be edited or removed once added to your Multi user PDF.Dimensional measurements made with an optical microscope are made on the optical image of the specimen and not directly on the specimen itself.
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Semiconductor Equipment & Materials Institute
|
| Status |
Current
|
| Supersedes |
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