SEMI PV13 : 2014(R2021)
Current
Current
The latest, up-to-date edition.
Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor
Available format(s)
Hardcopy
Language(s)
English
Published date
01-01-2021
Important note : Users cannot be edited or removed once added to your Multi user PDF.The excess-charge-carrier (hereafter referred to as ‘excess carrier’) recombination lifetime is the central parameter to silicon solar cell device design, production, and process control.
| DocumentType |
Test Method
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| Pages |
0
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| PublisherName |
Semiconductor Equipment & Materials Institute
|
| Status |
Current
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| Supersedes |
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