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SN EN 13925-1 : 2003

Current

Current

The latest, up-to-date edition.

NON-DESTRUCTIVE TESTING - X-RAY DIFFRACTION FROM POLYCRYSTALLINE AND AMORPHOUS MATERIAL - PART 1: GENERAL PRINCIPLES

Published date

12-01-2013

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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 General principles of X-ray powder diffraction (XRPD)
5 Meaning of the word "powder" in terms of X-ray diffraction
6 Characteristics of powder diffraction line profiles
7 Type of analysis
  7.1 General
  7.2 Phase identification (also referred to as "Qualitative
       phase analysis")
  7.3 Quantitative phase analysis
  7.4 Estimation of the crystalline and amorphous fractions
  7.5 Determination of lattice parameters
  7.6 Determination of crystal structures
  7.7 Refinement of crystal structures
  7.8 Characterisation of crystallographic texture
  7.9 Macrostress determination
  7.10 Analysis of crystalline size and microstrain
       7.10.1 General
       7.10.2 Determination of crystallite size (size of
              coherently scattering domains)
       7.10.3 Determination of microstrains
  7.11 Electron radial distribution function
8 Special experimental conditions
Annex A (informative) Relationships between the XRPD standards
Bibliography

Specifies the general principles of X-ray diffraction from polycrystalline and amorphous materials.

DocumentType
Standard
PublisherName
Swiss Standards
Status
Current

Standards Relationship
UNI EN 13925-1 : 2006 Identical
EN 13925-1:2003 Identical
DIN EN 13925-1:2003-07 Identical
BS EN 13925-1:2003 Identical
UNE-EN 13925-1:2006 Identical

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