SN EN 60444-2 : 1997
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - PART 2: PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS
12-01-2013
Committees responsible
National foreword
Method
1 Scope
2 Principle of measurement
3 Measuring circuit
4 Method of measurement
5 Measurement errors
6 Other measuring methods
Appendix
A
Figures
1 Equivalent circuit of a quartz crystal unit
2 Measuring circuit
3 Phase and impedance characteristics of a quartz crystal
unit in the vicinity of resonance
4 Deviation of C1 as a function of Rr for various error
conditions
5 Deviation of C1 as a function of measured phase angle error
and different phase angles
6 The effect of parallel capacitance CO on the measurement
accuracy C1 versus measured phase angle
Annex ZA (normative) Normative references to international
publications with their corresponding European publications
Gives a method for measurement of the motional capacitance of quartz crystal in the frequency range 1 MHz with a total measurement error of the order of 5%.
| DocumentType |
Standard
|
| PublisherName |
Swiss Standards
|
| Status |
Current
|
| Standards | Relationship |
| BS EN 60444-2:1997 | Identical |
| EN 60444-2:1997 | Identical |
| IEC 60444-2:1980 | Identical |
| DIN EN 60444-2:1997-10 | Identical |
| I.S. EN 60444-2:1999 | Identical |
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