SN EN 61338-1-3 : 2000

INTRODUCTION
1 Scope and object
2 Measuring parameters
3 Theory and calculation equations
      3.1 Relative permittivity and loss factor
      3.2 Determination of the relative conductivity of
             conducting plates
      3.3 Temperature coefficient of resonance frequency
      3.4 Temperature dependence of tan delta
4 Preparation of dielectric specimen
      4.1 Preparation of standard dielectric rods
      4.2 Preparation of test specimen
5 Measurement equipment and apparatus
      5.1 Measurement equipment
      5.2 Measurement apparatus for complex permittivity
      5.3 Measurement apparatus for temperature
             coefficient
6 Measurement procedure
      6.1 Measurement procedure for complex permittivity
      6.2 Measurement procedure for temperature
             coefficient
7 Accuracy and error estimation
      7.1 Measurement error due to the size of conducting
             plates
      7.2 Measurement error of relative conductivity
      7.3 Errors due to the airgap between dielectric rod
             and conducting plates or to field disturbance
      7.4 Result of round robin test (RRT)
Annex A - Bibliographyircuited at both ends by two parallel
          conducting pla7,5, d = 8,00 mm and h = 3,3 mm
Figure 1 - Configuration of a cylindrical dielectric rod
           resonator short-circuited at both ends by two
           parallel conducting plates
Figure 2 - Chart for relative permittivity calculation using
           TE01l mode
Figure 3 - Confirmation of standard dielectric rod
           resonators for measurement of conductivity of
           conducting plates
Figure 4 - Temperature dependence of fo (figure 4a) and tan
           delta (figure 4b) for five kinds of dielectrics
           (epsilon' = 21, 25, 30, 38 and 90)
Figure 5 - Mode chart of a dielectric rod resonator short-
           circuited at both ends by parallel conducting
           plates
Figure 6 - Schematic diagram of measurement equipment
Figure 7 - Measurement apparatus for complex permittivity
Figure 8 - Measurement apparatus for temperature coefficient
Figure 9 - Frequency response for TE011 mode resonator having
           epsilon' = 37,5, d = 8,00 mm and h = 3,3 mm
Figure 10 - Insertion attenuation IAo, resonance frequency
            fo and half-power bandwidth DELTAf
Figure 11 - Measurement error on epsilon' and tan delta by
            the size ratio d'ld
Table 1 - Examples of dimensions for standard dielectric rods
Table 2 - Example of TE011 mode resonance frequency for
          various epsilon' and dimensions of a dielectric
          specimen
Table 3 - Recommended dimensions and materials for conducting
          plate

Describes the dielectric rod resonator measurement method for a wide range of microwave dielectric properties in practical applications. The method has the following characteristics: - a complete, exact mathematical solution of complex relative permittivity is given by easy computer software; - the TCF is directly measured without any compensation with a measurement error under 1 x 10-6/K; - the measurement error is less than 0,3 % for the real components of the complex relative permittivity.