SS-EN IEC 60749-10, UTG 2:2022
Current
Current
The latest, up-to-date edition.
Semiconductor components - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
Published date
19-10-2022
Publisher
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| DocumentType |
Test Method
|
| PublisherName |
Standardiserings-Kommissionen I Sverige
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-10:2022 | Identical |
| EN IEC 60749-10:2022 | Identical |
| EN 60749-10:2002 | Identical |
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