SS-EN IEC 60749-37, UTG 2:2023
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Available format(s)
Hardcopy
Language(s)
English
Published date
22-02-2023
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| DocumentType |
Test Method
|
| Pages |
23
|
| PublisherName |
Standardiserings-Kommissionen I Sverige
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 60749-37:2022 | Identical |
| IEC 60749-37:2022 | Identical |
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