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UNE-EN 15991:2011
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The latest, up-to-date edition.
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Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in March of 2011.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2016
Publisher
Committee |
CTN 61
|
DocumentType |
Standard
|
Pages |
29
|
PublisherName |
Asociacion Espanola de Normalizacion
|
Status |
Current
|
SupersededBy |
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