UNE-EN 15991:2015
Current
Current
The latest, up-to-date edition.
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV) (Endorsed by AENOR in January of 2016.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2016
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
CTN 61
|
| DocumentType |
Standard
|
| Pages |
27
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 15991:2015 | Identical |
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