UNE-EN 60749-23:2005/A1:2011
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
Amendment of
Available format(s)
Hardcopy , PDF
Language(s)
Spanish, Castilian, English
Published date
21-12-2011
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
CTN 209/SC 47
|
| DocumentType |
Amendment
|
| Pages |
8
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
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