UNE-EN 60749-27:2006/A1:2012
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Amendment of
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2013
Publisher
| Committee |
CTN 209/SC 47
|
| DocumentType |
Amendment
|
| Pages |
11
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
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