UNE-EN 60749-29:2011
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-11-2011
Publisher
€71.00
Excluding VAT
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN 60749-29:2011 | Equivalent |
| BS EN 60749-29:2011 | Equivalent |
| EN 60749-29:2011 | Identical |
| IEC 60749-29:2011 | Identical |
Summarise
Important note : Users cannot be edited or removed once added to your Multi user PDF.