UNE-EN 60749-4:2017
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-07-2017
Publisher
€42.00
Excluding VAT
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test(HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductordevices in humid environments.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4002-1
|
| Pages |
19
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-4:2017 | Identical |
| EN 60749-4:2017 | Identical |
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