UNE-EN 60749-44:2016
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-12-2016
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-3541-6
|
| Pages |
28
|
| ProductNote |
THIS STANDARD ALSO REFERS TO:JESD89-2A. THIS STANDARD IS IDENTICAL TO :IEC 60749-44
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-44:2016 | Identical |
| EN 60749-44:2016 | Identical |
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