UNE-EN 61189-5-503:2017
Current
The latest, up-to-date edition.
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards (Endorsed by Asociación Española de Normalización in September of 2017.)
Hardcopy , PDF
English
01-09-2017
This international standard specifies the conductive anodic filament (hereafter called as CAF)
and specifies not only steady state temperature and humidity test but temperature-humidity
cyclic test, unsaturated pressurized vapour test (generally called as HAST Highly
Accelerated temperature and humidity Stress Test), and dew condensation cyclic test.
| Committee |
CTN 203/SC 91-119
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-4320-6
|
| Pages |
33
|
| ProductNote |
THIS STANDARD ALSO REFERS TO :IPC-TM-650 No.2.6.25,IPC-TM-650 No.2.6.14.1,IPC-TM-650 No.2.6.19,IPC-9691B
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| EN 61189-5-503:2017 | Identical |
| IEC 61189-5-503:2017 | Identical |
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Important note : Users cannot be edited or removed once added to your Multi user PDF.