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  • UNE-EN 62374-1:2010

    Current The latest, up-to-date edition.

    Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-03-2011

    Publisher:  Asociacion Espanola de Normalizacion

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    Committee CTN 209/SC 47
    Document Type Standard
    Product Note THIS STANDARD IS IDENTICAL TO EN 62374-1:2010
    Publisher Asociacion Espanola de Normalizacion
    Status Current
    Supersedes
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