UNE-EN IEC 60749-23:2026
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (Endorsed by Asociación Española de Normalización in March of 2026.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-03-2026
Publisher
€58.00
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This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in , may be used to screen for infant-mortality related failures. The detailed use and application of burn-in is outside the scope of this standard.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
17
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN IEC 60749-23:2026 | Equivalent |
| BS EN IEC 60749-23:2026 | Equivalent |
| IEC 60749-23:2025 | Identical |
| EN IEC 60749-23:2026 | Identical |
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