UNE-EN IEC 60749-37:2022
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Española de Normalización in January of 2023.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2023
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
29
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| EN IEC 60749-37:2022 | Identical |
| IEC 60749-37:2022 | Identical |
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