Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)

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Published date

01-03-2024

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Asociación Española de Normalización

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This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive.

Committee	CTN 209/SC 47
DocumentType	Standard
Pages	18
PublisherName	Asociación Española de Normalización
Status	Current

Standards	Relationship
EN IEC 60749-5:2024	Identical
IEC 60749-5:2023	Identical
BS EN IEC 60749-5:2024	Equivalent
DIN EN IEC 60749-5:2024-09	Equivalent

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UNE-EN IEC 60749-5:2024

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)

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UNE-EN IEC 60749-5:2024

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)

Abstract

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