Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)

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English

Published date

01-07-2023

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Asociación Española de Normalización

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This measurement procedure defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

Committee	CTN 209/SC 47
DocumentType	Standard
Pages	26
PublisherName	Asociación Española de Normalización
Status	Current

Standards	Relationship
EN IEC 61967-8:2023	Identical
IEC 61967-8:2023	Identical
BS EN IEC 61967-8:2023	Equivalent

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UNE-EN IEC 61967-8:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)

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UNE-EN IEC 61967-8:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)

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