Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in June of 2025.)

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Hardcopy , PDF

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English

Published date

01-06-2025

Publisher

Asociación Española de Normalización

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This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

Committee	CTN 209/SC 49
DocumentType	Standard
Pages	50
PublisherName	Asociación Española de Normalización
Status	Current

Standards	Relationship
BS EN IEC 62276:2025	Equivalent
IEC 62276:2025	Identical
EN IEC 62276:2025	Identical

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UNE-EN IEC 62276:2025

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in June of 2025.)

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UNE-EN IEC 62276:2025

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in June of 2025.)

Abstract

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