UNE-EN IEC 62969-4:2018
Current
The latest, up-to-date edition.
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)
Hardcopy , PDF
English
01-10-2018
This document is to develop a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurence in the vehicle communications interface.It offers many new possibilities for the analysis of data interface errors. A representation of the physical layer is particularly during the execution of conformity tests, often indispensable. With data interface-specific trigger conditions and time synchronization, it can find the causes of protocol errors much quicker than with a traditional test method.Figure 1 - The semiconductor-based sensor data interface test with fault injection
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-5791-3
|
| Pages |
27
|
| ProductNote |
THIS STANDARD ALSO REFERS TO IEC 60050-722
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 62969-4:2018 | Identical |
| IEC 62969-4:2018 | Identical |
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.