Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)

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Hardcopy , PDF

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English

Published date

01-06-2023

Publisher

Asociación Española de Normalización

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This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Committee	CTN 209/SC 47
DocumentType	Standard
Pages	24
PublisherName	Asociación Española de Normalización
Status	Current

Standards	Relationship
I.S. EN IEC 63287-2:2023	Equivalent
BS EN IEC 63287-2:2023	Equivalent
IEC 63287-2:2023	Identical
EN IEC 63287-2:2023	Identical
IEC 63287-2:2023	Equivalent
EN IEC 63287-2:2023	Equivalent

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UNE-EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)

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UNE-EN IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)

Abstract

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