UNE-EN ISO 8289-1:2020
Current
The latest, up-to-date edition.
Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects - Part 1: Swab test for non-profiled surfaces (ISO 8289-1:2020)
Hardcopy , PDF
English, Spanish, Castilian
28-10-2020
This document specifies two low voltage tests for detecting and locating defects that extend to the basismetal in vitreous and porcelain enamel coatings.Method A (electrical) is suitable for the rapid detection and determination of the general location ofdefects. Method B (optical), based on colour effects, is suitable for the more precise detection of defectsand their exact locations. Both methods are commonly applied to flat surfaces. For more intricateshapes such as undulated and/or corrugated surfaces ISO 8289-2 has to be applied.NOTE 1 Selection of the correct test method is critical to distinguish the areas of increased conductivitydetected by Method B from actual pores that extend to the basis metal, which can be detected by both methods.NOTE 2 The low voltage test is a non-destructive method of detecting defects (see Clause 3) and therefore, iscompletely different from the high voltage test specified in ISO 2746. The result of high and low voltage test arenot comparable and will differ.
| Committee |
CTN 112
|
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| EN ISO 8289-1:2020 | Identical |
| ISO 8289-1:2020 | Identical |
| BS 876:1981 | Identical |
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