UNI EN ISO 21254-2 : 2011
Current
The latest, up-to-date edition.
LASERS AND LASER-RELATED EQUIPMENT - TEST METHODS FOR LASER-INDUCED DAMAGE THRESHOLD - PART 2: THRESHOLD DETERMINATION
06-10-2011
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Test methods
5 Accuracy
6 Test report
Annex A (informative) - Example of a measurement procedure
(1-on-1 test)
Annex B (informative) - Example of a test report for a 1-on-1
test
Annex C (informative) - Example of a measurement procedure
(S-on-1 test)
Annex D (informative) - Example of a test report for an S-on-1
test
Annex E (informative) - Extrapolation method for S-on-1 tests
Annex F (informative) - Conversion of damage data into defect
densities
Bibliography
Explains 1-on-1 and S-on-1 tests for the determination of the laser-induced damage threshold of optical laser components.
| Committee |
CT 44
|
| DocumentType |
Test Method
|
| PublisherName |
Ente Nazionale Italiano di Unificazione (UNI)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 21254-2:2011 | Identical |
| EN ISO 21254-2:2011 | Identical |
| ISO/TR 21254-4:2011 | Lasers and laser-related equipment Test methods for laser-induced damage threshold Part 4: Inspection, detection and measurement |
| ISO 15367-1:2003 | Lasers and laser-related equipment Test methods for determination of the shape of a laser beam wavefront Part 1: Terminology and fundamental aspects |
| ISO 21254-1:2011 | Lasers and laser-related equipment — Test methods for laser-induced damage threshold — Part 1: Definitions and general principles |
| ISO 15367-2:2005 | Lasers and laser-related equipment Test methods for determination of the shape of a laser beam wavefront Part 2: Shack-Hartmann sensors |
| ISO 21254-3:2011 | Lasers and laser-related equipment Test methods for laser-induced damage threshold Part 3: Assurance of laser power (energy) handling capabilities |
| ISO 11145:2016 | Optics and photonics Lasers and laser-related equipment Vocabulary and symbols |
| ISO 10110-7:2017 | Optics and photonics — Preparation of drawings for optical elements and systems — Part 7: Surface imperfections |
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