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  • MIL H 38534 : B (1)

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR

    Available format(s): 

    Superseded date:  23-08-1995

    Language(s): 

    Published date:  12-01-2013

    Publisher:  US Military Specs/Standards/Handbooks

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    Abstract - (Show below) - (Hide below)

    Specification for hybrid microcircuits, including quality and reliability requirements. Coverage includes applicable documents, traceability, visual examination, wire bond strength testing, visual inspection, radiation testing equipment, passive elements, wire bond strength, test equipment verification, manufacturer imposed tests, element evaluation, and location of element evaluation. Also gives detailed tables.

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    Committee FSC 5962
    Development Note Supersedes MIL M 38534 (07/2004)
    Document Type Standard
    Publisher US Military Specs/Standards/Handbooks
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-STD-975 Revision M:1994 NASA STANDARD (EEE) PARTS LIST
    GEIA TA HB 0009 : 2013 RELIABILITY PROGRAM HANDBOOK
    MIL-STD-1547 Revision B:1992 ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES
    MIL-HDBK-338 Revision B:1998 ELECTRONIC RELIABILITY DESIGN HANDBOOK
    MIL R 28750 : C SUPP 1 RELAYS, SOLID STATE, SEALED, OPTICALLY ISOLATED, ZERO VOLTAGE TURN ON, 25 AMPERES, 250 VOLTS MAXIMUM, 45-440 HZ, POWER SWITCHING
    MIL D 83532 : A (3) SUPP 1 DELAY LINES, ACTIVE
    MIL BULL 103 : AC NOTICE 1 LIST OF STANDARD MICROCIRCUIT DRAWINGS
    MIL-M-38510-136 Revision A:1995 MICROCIRCUITS, LINEAR, PRECISION VOLTAGE REFERENCES, MONOLITHIC SILICON
    MIL D 83532/5 : (1) DELAY LINES, ACTIVE, 16-PIN DIP COMPATIBLE, PROGRAMMABLE 3-BIT, TTL COMPATIBLE
    MIL D 83532/1 : A DELAY LINES, 14 PIN DIP COMPATIBLE, 5 TAP
    MIL-HDBK-814 Base Document:1994 IONIZING DOSE AND NEUTRON HARDNESS ASSURANCE GUIDELINES FOR MICROCIRCUITS AND SEMICONDUCTOR DEVICES
    MIL-STD-1772 Revision B:1990 CERTIFICATION REQUIREMENTS FOR HYBRID MICROCIRCUITS FACILITIES AND LINES
    MIL D 83532/3 : A DELAY LINES, 14 PIN DIP COMPATIBLE, 10 TAP
    MIL D 83532/2 : B DELAY LINES, 14 PIN DIP COMPATIBLE, 5 TAP
    MIL-STD-1562 Revision W:1991 LISTS OF STANDARD MICROCIRCUITS
    MIL O 55310 : C OSCILLATOR, CRYSTAL, GENERAL SPECIFICATION FOR
    MIL D 83532/6 : (1) DELAY LINES, ACTIVE, 16-PIN DIP COMPATIBLE, PROGRAMMABLE 3-BIT, EMITTER-COUPLED LOGIC
    MIL-M-24791-1 Base Document:1995 MODULE, FIBER OPTIC, TRANSMITTER, DIGITAL, 160 MBD, ASSOCIATED DETAIL SPECIFICATION FOR
    MIL-P-24764 Base Document:1991 POWER SUPPLIES, SHIPBOARD, ELECTRONIC, GENERAL SPECIFICATION FOR

    Standards Referencing This Book - (Show below) - (Hide below)

    MIL-STD-1772 Revision B:1990 CERTIFICATION REQUIREMENTS FOR HYBRID MICROCIRCUITS FACILITIES AND LINES
    MIL-STD-280 Revision A:1969 DEFINITIONS OF ITEM LEVELS, ITEM EXCHANGEABILITY, MODELS, AND RELATED TERMS
    MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
    MIL-STD-975 Revision M:1994 NASA STANDARD (EEE) PARTS LIST
    ASTM F 30 : 1996 Standard Specification for Iron-Nickel Sealing Alloys
    MIL-STD-45662 Revision A:1988 CALIBRATION SYSTEMS REQUIREMENTS
    MIL-STD-750 Revision F:2011 TEST METHODS FOR SEMICONDUCTOR DEVICES
    FED-STD-209 Revision E:1992 AIRBORNE PARTICULATE CLEANLINESS CLASSES IN CLEANROOMS AND CLEAN ZONES
    ASTM B 567 : 1998 Standard Test Method for Measurement of Coating Thickness by the Beta Backscatter Method
    MIL-STD-1520 Revision C:1986 CORRECTIVE ACTION AND DISPOSITION SYSTEM FOR NONCONFORMING MATERIAL
    MIL-STD-977 Base Document:1982 TEST METHODS AND PROCEDURES FOR MICROCIRCUIT LINE CERTIFICATION
    MIL-STD-100 Revision G:1997 ENGINEERING DRAWINGS
    MIL-STD-1331 Base Document:1969 PARAMETER TO BE CONTROLLED FOR THE SPECIFICATION OF MICROCIRCUITS
    MIL-STD-202 Revision H:2015 ELECTRONIC AND ELECTRICAL COMPONENT PARTS
    MIL-STD-1285 Revision D:2004 MARKING OF ELECTRICAL AND ELECTRONIC PARTS
    MIL-STD-976 Revision B:1988 CERTIFICATION REQUIREMENTS FOR JAN MICROCIRCUITS
    MIL-STD-1835 Revision D:2004 ELECTRONIC COMPONENT CASE OUTLINES
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