01/206130 DC : DRAFT AUG 2001
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY
Superseded date
07-03-2006
Superseded by
Published date
23-11-2012
Publisher
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| Committee |
EPL/47
|
| DocumentType |
Draft
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| ES 59008-6-2 : 2001 | DATA REQUIREMENTS FOR SEMI CONDUCTOR DIE - DATA DICTIONARY |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| ES 59008-6-1 : 1999 | DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 6-1 - EXCHANGE DATA FORMATS AND DATA DICTIONARY - DATA EXCHANGE - DDX FILE FORMAT |
| ISO/IEC 11179-3:2013 | Information technology — Metadata registries (MDR) — Part 3: Registry metamodel and basic attributes |
| IEC 61360-4:2005 | Standard data element types with associated classification scheme for electric components - Part 4: IEC reference collection of standard data element types and component classes |
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| EIA 554 : 1996 | METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM) |
| MIL-PRF-38534 Revision J:2015 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| IEC 61360-2:2012 | Standard data element types with associated classification scheme for electric components - Part 2: EXPRESS dictionary schema |
| FED-STD-209 Revision E:1992 | AIRBORNE PARTICULATE CLEANLINESS CLASSES IN CLEANROOMS AND CLEAN ZONES |
| IEC 61360-1:2017 | Standard data element types with associated classification scheme - Part 1: Definitions - Principles and methods |
| EN 100015-1 : 1992 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BASIC SPECIFICATION: PROTECTION OF ELECTROSTATIC SENSITIVE DEVICES - GENERAL REQUIREMENTS |
| IEEE 1076-2008 REDLINE | IEEE Standard VHDL Language Reference Manual |
| ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
| IEC 60191-4:2013 | Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages |
| EIA 557 : 2006 | STATISTICAL PROCESS CONTROL SYSTEMS |
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