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  • EIA 554 : 1996

    Current The latest, up-to-date edition.

    METHOD SELECTION FOR ASSESSMENT OF NONCONFORMING LEVELS IN PARTS PER MILLION (PPM)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2002

    Publisher:  Government Electronics & Information Technology Association

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    Table of Contents - (Show below) - (Hide below)

    1. INTRODUCTION
    2. SCOPE
    3. APPLICATION
    4. APPLICABLE DOCUMENTS
    5. DEFINITIONS
    6. ASSUMPTIONS
    7. METHODS
    8. SUMMARY

    Abstract - (Show below) - (Hide below)

    Gives guidance for selecting standardized methods for estimating the proportion nonconforming expressed as PPM.

    General Product Information - (Show below) - (Hide below)

    Document Type Standard
    Publisher Government Electronics & Information Technology Association
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    MIL-R-39008 Revision C:1990 RESISTOR, FIXED, COMPOSITION (INSULATED), ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    BS EN 62258-1:2010 Semiconductor die products Procurement and use
    MIL C 39003 : H CAPACITOR, FIXED, ELECTROLYTIC (SOLID ELECTROLYTE) TANTALUM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR
    MIL C 55681 : D SUPP 1 CAPACITOR, CHIP, MULTIPLE LAYER, FIXED UNENCAPSULATED, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    I.S. EN 62258-1:2010 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
    EN 62258-1:2010 Semiconductor die products - Part 1: Procurement and use
    01/206130 DC : DRAFT AUG 2001 IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY
    ISO 14560:2004 Acceptance sampling procedures by attributes Specified quality levels in nonconforming items per million
    ISO 28597:2017 Acceptance sampling procedures by attributes — Specified quality levels in nonconforming items per million
    MIL R 55342 : C RESISTORS, FIXED, FILM, CHIP, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL C 23269 : E CAPACITORS, FIXED, GLASS DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL R 39005 : D RESISTOR, FIXED, WIREWOUND, (ACCURATE), ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL C 39014 : E CAPACITOR, FIXED, CERAMIC DIELECTRIC (GENERAL PURPOSE) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL C 39006 : E CAPACITORS, FIXED, ELECTROLYTIC (NONSOLID ELECTROLYTE), TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    PD ES 59008-2:1999 Data requirements for semiconductor die Vocabulary
    MIL R 39015 : C (3) RESISTOR, VARIABLE, WIRE WOUND (LEAD SCREW ACTUATED), ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR
    MIL C 83421 : B CAPACITOR, FIXED, SUPERMETALLIZED PLASTIC FILM DIELECTRIC, (DC, AC, OR DC AND AC) HERMETICALLY SEALED IN METAL CASES, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL R 39007 : G (3) SUPP 1A RESISTORS, FIXED, WIRE-WOUND (POWER TYPE), NONESTABLISHED RELIABILITY, ESTABLISHED RELIABILITY, AND SPACE LEVEL, GENERAL SPECIFICATION FOR
    BS ISO 28597:2017 Acceptance sampling procedures by attributes. Specified quality levels in nonconforming items per million
    MIL C 55514 : C CAPACITOR, FIXED, PLASTIC (OR METALLIZED PLASTIC) DIELECTRIC, DC OR DC AC, IN NONMETAL CASES, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR
    MIL C 49467 : (2) SUPP 1 CAPACITORS, FIXED, CERAMIC, MULTILAYER, HIGH VOLTAGE (GENERAL PURPOSE) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL-R-874 Base Document:1990 RESISTOR NETWORKS, FIXED, FILM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL C 49464 : A CAPACITORS, CHIP, SINGLE LAYER, FIXED, PARALLEL PLATE, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY
    MIL R 914 : 0 RESISTOR NETWORKS, FIXED, FILM, SURFACE MOUNT, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL R 39009 : C (3) SUPP 1 RESISTOR, FIXED, WIREWOUND (POWER TYPE, CHASSIS MOUNTED) ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR
    BS ISO 14560:2004 Acceptance sampling procedures by attributes. Specified quality levels in nonconforming items per million
    MIL C 39001 : B CAPACITOR, FIXED, MICA DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR..
    MIL R 55182 : F RESISTORS, FIXED, FILM, ESTABLISHED RELIABILITY GENERAL SPECIFICATION FOR
    MIL S 19500 : J SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
    MIL C 55365 : C (5) CAPACITOR, CHIP, FIXED, TANTALUM, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    MIL R 39017 : E (5) SUPP 1 RESISTOR, FIXED, FILM (INSULATED) ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
    IEC 62258-1:2009 Semiconductor die products - Part 1: Procurement and use
    CEI EN 62258-1 : 2011 SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE

    Standards Referencing This Book - (Show below) - (Hide below)

    EIA 591 : 1992(R2002) ASSESSMENT OF QUALITY LEVELS IN PPM USING VARIABLES TEST DATA
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