Comment Closes On
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|
Committee
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GEL/86/3 |
Document Type
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Draft |
ISBN
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|
Pages
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Published
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|
Publisher
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British Standards Institution
|
Status
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Superseded |
Superseded By
|
|
IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV
|
Information technology equipment - Safety - Part 1: General requirements |
MIL-STD-883 Revision K:2016
|
TEST METHOD STANDARD - MICROCIRCUITS |
IEC 62007-1:2015
|
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
IEC 61300-2-48:2009
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling |
IEC 62007-2:2009
|
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
IEC 60938-1:1999+AMD1:2006 CSV
|
Fixed inductors for electromagnetic interference suppression - Part 1: Generic specification |
IEC 62148-1:2017
|
Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance |
IEC 61300-2-4:1995
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention |
IEC 62149-1:2011
|
Fibre optic active components and devices - Performance standards - Part 1: General and guidance |
IEC 61300-2-19:2012
|
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state) |
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