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  • BS EN 62149-2:2014

    Current The latest, up-to-date edition.

    Fibre optic active components and devices. Performance standards 850 nm discrete vertical cavity surface emitting laser devices

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  31-08-2014

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions, symbols
      and abbreviations
    4 Product parameters
    5 Testing
    6 Environmental specifications
    Annex A (normative) - Specifications for multimode 850-nm
            VCSEL device without a monitor photodiode (Case a)
    Annex B (normative) - Specifications for multimode 850 nm
            VCSEL device with a monitor photodiode (Case b)
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    Defines the performance specification for 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices of transverse multimode types used for the fibre optic telecommunication and optical data transmission applications.

    Scope - (Show below) - (Hide below)

    IEC 62149-2:2014 covers the performance specification for 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices of transverse multimode types used for fibre optic telecommunication and optical data transmission applications. The performance standard contains a definition of the product performance requirements together with a series of sets of tests and measurements with clearly defined conditions, severities, and pass/fail criteria. The tests are intended to be run on a \'once-off\' basis to prove any product\'s ability to satisfy the performance standard\'s requirements. This second edition cancels and replaces the first edition published in 2009 and constitutes a technical revision. The significant technical changes with respect to the previous edition include the introduction of the performance standards for 10 Gbit/s 850-nm wavelength, vertical cavity surface emitting laser (VCSEL) devices and the deletion of the package diagrams and pin configurations in Clause A.4 and Clause B.4 by citing the VCSEL package standard IEC 62148-15 instead. Keywords: 850-nm discrete vertical cavity surface emitting laser (VCSEL) devices, transverse multimode types

    General Product Information - (Show below) - (Hide below)

    Committee GEL/86/3
    Development Note Supersedes 07/30167056 DC. (01/2010) Supersedes 13/30277888 DC. (08/2014)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60950-1:2005+AMD1:2009+AMD2:2013 CSV Information technology equipment - Safety - Part 1: General requirements
    IEC 62148-15:2014 Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages
    IEC GUIDE 107:2014 Electromagnetic compatibility - Guide to the drafting of electromagnetic compatibility publications
    IEC 61280-1-3:2010 Fibre optic communication subsystem test procedures - Part 1-3: General communication subsystems - Central wavelength and spectral width measurement
    EN 60825-1:2014/AC:2017-06 SAFETY OF LASER PRODUCTS - PART 1: EQUIPMENT CLASSIFICATION AND REQUIREMENTS (IEC 60825-1:2014)
    IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
    IEC 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
    IEC 61300-2-48:2009 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling
    IEC 60749-11:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
    EN 60950-1:2006/A2:2013 INFORMATION TECHNOLOGY EQUIPMENT - SAFETY - PART 1: GENERAL REQUIREMENTS (IEC 60950-1:2005/A2:2013, MODIFIED)
    EN 62148-15:2014 Fibre optic active components and devices - Package and interface standards - Part 15: Discrete vertical cavity surface emitting laser packages
    IEC 60825-1:2014 Safety of laser products - Part 1: Equipment classification and requirements
    IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
    EN 60749-11:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
    IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
    EN 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
    IEC 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
    EN 61300-2-4:1997 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention
    IEC 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
    IEC 62148-1:2017 Fibre optic active components and devices - Package and interface standards - Part 1: General and guidance
    EN 60749-7:2011 Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
    EN 60749-6:2017 Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
    EN 60749-26:2014 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
    IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
    IEC 61300-2-4:1995 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-4: Tests - Fibre/cable retention
    IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
    EN 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling
    IEC 62149-1:2011 Fibre optic active components and devices - Performance standards - Part 1: General and guidance
    IEC 61300-2-19:2012 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state)
    EN 61300-2-19:2013 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-19: Tests - Damp heat (steady state)
    IEC 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
    EN 61300-2-48:2009 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-48: Tests - Temperature-humidity cycling
    EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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