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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    BS EN 61709 ED 3.0 - ELECTRIC COMPONENTS - RELIABILITY - REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION

    Available format(s):  Hardcopy, PDF

    Superseded date:  31-07-2017

    Language(s):  English

    Published date: 

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions and symbols
    4 Context and conditions
    5 Generic reference conditions and stress models
    6 Integrated semiconductor circuits
    7 Discrete semiconductors
    8 Optoelectronic components
    9 Capacitors
    10 Resistors and resistor networks
    11 Inductors, transformers and coils
    12 Microwave devices
    13 Other passive components
    14 Electrical connections
    15 Connectors and sockets
    16 Relays
    17 Switches and push-buttons
    18 Signal and pilot lamps
    19 Printed circuit boards (PCB)
    20 Hybrid circuits
    Annex A (Normative) - Failure modes of components
    Annex B (Informative) - Thermal model for semiconductors
    Annex C (Informative) - Failure rate prediction
    Annex D (informative) - Considerations on mission profile
    Annex E (informative) - Useful life models
    Annex F (informative) - Physics of failure
    Annex G (informative) - Considerations for the design of
            a data base on failure rates
    Annex H (informative) - Potential sources of failure rate
            data and methods of selection
    Annex I (informative) - Overview of component classification
    Annex J (informative) - Presentation of component reliability
            data
    Annex K (informative) - Examples
    Bibliography
    Literature

    General Product Information - (Show below) - (Hide below)

    Comment Closes On
    Committee DS/1
    Document Type Draft
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 62308:2006 Equipment reliability - Reliability assessment methods
    IEC 61812-1:2011 Time relays for industrial and residential use - Part 1: Requirements and tests
    IEC 61649:2008 Weibull analysis
    IEC 61014:2003 Programmes for reliability growth
    IEC 60050-151:2001 International Electrotechnical Vocabulary (IEV) - Part 151: Electrical and magnetic devices
    IEC 61360-4:2005 Standard data element types with associated classification scheme for electric components - Part 4: IEC reference collection of standard data element types and component classes
    VITA 51.2 : 2016 PHYSICS OF FAILURE RELIABILITY PREDICTIONS
    ISO 10303-31:1994 Industrial automation systems and integration Product data representation and exchange Part 31: Conformance testing methodology and framework: General concepts
    ISO 10303-11:2004 Industrial automation systems and integration Product data representation and exchange Part 11: Description methods: The EXPRESS language reference manual
    IEC 61810-2:2017 Electromechanical elementary relays - Part 2: Reliability
    IEC 61163-2:1998 Reliability stress screening - Part 2: Electronic components
    DEFSTAN 00-42(PT3)/4(2011) : 2011 RELIABILITY AND MAINTAINABILITY ASSURANCE GUIDE - PART 3: R&M CASE
    IEC 60300-3-2:2004 Dependability management - Part 3-2: Application guide - Collection of dependability data from the field
    IEC 61810-2-1:2017 Electromechanical elementary relays - Part 2-1: Reliability - Procedure for the verification of B10 values
    IEC 61703:2016 Mathematical expressions for reliability, availability, maintainability and maintenance support terms
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    MIL-C-18312 Revision G:2013 CAPACITOR, FIXED, METALLIZED (PAPER-PLASTIC, OR PLASTIC FILM) DIELECTRIC, DIRECT CURRENT (HERMETICALLY SEALED IN METAL CASES), GENERAL SPECIFICATION FOR
    IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
    IEC 60300-3-5:2001 Dependability management - Part 3-5: Application guide - Reliability test conditions and statistical test principles
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