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18/30368966 DC : 0

Current

Current

The latest, up-to-date edition.

BS ISO 14701 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - MEASUREMENT OF SILICON OXIDE THICKNESS

Available format(s)

Hardcopy , PDF

Language(s)

English

€23.37
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Foreword
Introduction
1 Scope
2 Symbols and abbreviations
3 Outline of method
4 Method for measuring the oxide thickness
Bibliography

BS ISO 14701.

Committee
CII/60
DocumentType
Draft
Pages
24
PublisherName
British Standards Institution
Status
Current

ISO 18116:2005 Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
ISO/TR 18392:2005 Surface chemical analysis X-ray photoelectron spectroscopy Procedures for determining backgrounds
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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