• ECMA/TR 93 : 1ED 2007

    Current The latest, up-to-date edition.

    MEASURING EMISSIONS FROM MODULES

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    Published date:  12-01-2013

    Publisher:  European Computer Manufacturers Association

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 References
    3 Definitions and abbreviations
      3.1 Definitions
          3.1.1 Magnetic probe
          3.1.2 Module
      3.2 Abbreviations
    4 Measuring facility
      4.1 Shielded room
      4.2 Fixture for magnetic probe
      4.3 Measuring instruments
          4.3.1 Measuring receiver
          4.3.2 Spectrum analyzer
          4.3.3 Magnetic probe
      4.4 Test board
    5 Measuring Method
      5.1 Temperature
      5.2 Power supply
      5.3 Positioning of MUT and magnetic probe
          5.3.1 Positioning of MUT
          5.3.2 Space and positioning of magnetic probe
      5.4 Measurement procedure
      5.5 Reporting measurement results
    6 Method for calibrating the magnetic probe
      6.1 Application
      6.2 Measuring instruments used for calibrating the
          magnetic probe
          6.2.1 Preamplifier
          6.2.2 Micro-strip line
          6.2.3 Other measuring instruments
      6.3 Calibration procedures
    Annex A - Conditions for measuring emissions from the Module
              Under Test
      A.1 Test board
          A.1.1 Layer placement
          A.1.2 Decoupling capacitor
          A.1.3 Other components
          A.1.4 Measuring circuit
      A.2 Integrated memory
          A.2.1 Placement of MUT
          A.2.2 Operating conditions
      A.3 Integrated disk unit
          A.3.1 Placement of MUT
          A.3.2 Operating conditions
      A.4 Interface board
          A.4.1 Placement of MUT
          A.4.2 Operating conditions
    Annex B - Current measurements with a magnetic probe
    Annex C - Influence of magnetic-probe placement on measured
              values

    Abstract - (Show below) - (Hide below)

    Provides guidelines for measuring electromagnetic emissions from modules, in view of assessing the impact of such modules on emissions from products, which may incorporate them.

    General Product Information - (Show below) - (Hide below)

    Document Type Technical Report
    Publisher European Computer Manufacturers Association
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
    CISPR 16-1-1:2015 Specification for radio disturbance and immunity measuring apparatus and methods - Part 1-1: Radio disturbance and immunity measuring apparatus - Measuring apparatus
    IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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