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  • IEC 61967-1:2002

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  12-09-2022

    Language(s):  English - French

    Published date:  12-03-2002

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 Definitions
    4 Test conditions
       4.1 General
       4.2 Ambient conditions
            4.2.1 Ambient temperature
            4.2.2 Ambient RF field strength
            4.2.3 Other ambient conditions
            4.2.4 IC stability over time
    5 Test equipment
       5.1 General
       5.2 Shielding
       5.3 RF measuring instrument
            5.3.1 Measuring receiver
            5.3.2 Spectrum analyzer
            5.3.3 Other RBW for narrowband disturbances
            5.3.4 Disturbance type, detector type and sweep
                  speed
            5.3.5 Video bandwidth
            5.3.6 Verification of calibration for the RF
                  measuring instrument
       5.4 Frequency range
       5.5 Pre-amplifier or attenuator
       5.6 System gain
       5.7 Other components
    6 Test set-up
       6.1 General
       6.2 Test circuit board
       6.3 IC pin loading
       6.4 Power supply requirements - Test board power supply
       6.5 IC specific considerations
            6.5.1 IC supply voltage
            6.5.2 IC decoupling
            6.5.3 Activity of IC
            6.5.4 Guidelines regarding IC operation
    7 Test procedure
       7.1 Ambient check
       7.2 Operational check
       7.3 Specific procedures
    8 Test report
       8.1 General
       8.2 Ambient
       8.3 Description of device
       8.4 Description of set-up
       8.5 Description of software
       8.6 Data presentation
            8.6.1 Graphical presentation
            8.6.2 Software for data capture
            8.6.3 Data processing
       8.7 RF emission limits
       8.8 Interpretation of results
            8.8.1 Comparison between IC(s) using the same
                  test method
            8.8.2 Comparison between different test methods
            8.8.3 Correlation to module test methods
    9 General basic test board specification
       9.1 Board description - mechanical
       9.2 Board description - electrical characteristics
       9.3 Ground planes
       9.4 Pins
            9.4.1 DIL packages
            9.4.2 SOP, PLCC, QFP packages
            9.4.3 PGA, BGA packages
       9.5 Via type
       9.6 Via distance
       9.7 Additional components
            9.7.1 Supply decoupling
            9.7.2 I/O load
    Annex A (informative) Test method comparison
    Annex B (informative) Flow chart of an example counter
            test code
    Annex C (informative) Prescription of a worst-case
            application software description
    Bibliography
    Figures

    Abstract - (Show below) - (Hide below)

    Provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. Also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included to assist in selecting the appropriate measurement method(s). Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

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    Committee TC 47/SC 47A
    Development Note Also numbered as BS EN 61967-1 (07/2002) Stability Date: 2017. (10/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 61967-8:2011 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
    PD IEC/TR 61967-4-1:2005 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. 1 Ohm/150 Ohm direct coupling method. Application guidance to IEC 61967-4
    03/112147 DC : DRAFT JULY 2003 IEC 61967-3 ED.1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 3: MEASUREMENT OF RADIATED EMISSIONS - SURFACE SCAN METHOD
    BS EN 61000-4-7 : 2002 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-7: TESTING AND MEASUREMENT TECHNIQUES - GENERAL GUIDE ON HARMONICS AND INTERHARMONICS MEASUREMENTS AND INSTRUMENTATION, FOR POWER SUPPLY SYSTEMS AND EQUIPMENT CONNECTED THERETO
    PD IEC/TS 61967-3:2014 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
    BS EN 62228-2:2017 Integrated circuits. EMC evaluation of transceivers LIN transceivers
    I.S. EN 62132-1:2016 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
    ISO/IEC/IEEE 8802-3:2017 Information technology Telecommunications and information exchange between systems Local and metropolitan area networks Specific requirements Part 3: Standard for Ethernet
    EN 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
    EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
    EN 62433-3:2017 EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    I.S. EN 61967-4:2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
    CEI EN 61967-2 : 2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
    06/30152634 DC : DRAFT JULY 2006
    NF EN 61000-4-7 : 2003 AMD 1 2009 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-7: TESTING AND MEASUREMENT TECHNIQUES - GENERAL GUIDE ON HARMONICS AND INTERHARMONICS MEASUREMENTS AND INSTRUMENTATION, FOR POWER SUPPLY SYSTEMS AND EQUIPMENT CONNECTED THERETO
    09/30191130 DC : DRAFT FEB 2009 BS EN 61967-8 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
    CEI EN 62228-2 : 1ED 2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    DD IEC TS 61967-3 : DRAFT JAN 2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - MEASUREMENT OF RADIATED EMISSIONS - SURFACE SCAN METHOD
    CEI EN 62433-3 : 1ED 2017 EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEMRE)
    ECMA/TR 93 : 1ED 2007 MEASURING EMISSIONS FROM MODULES
    BS EN 61967-6 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    I.S. EN 61967-8:2011 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD (IEC 61967-8:2011 (EQV))
    I.S. EN 62228-2:2017 INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 2: LIN TRANSCEIVERS
    CEI EN 61967-4 : 2009 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
    IEC TS 62239:2008 Process management for avionics - Preparation of an electronic components management plan
    BS EN 61967-4 : 2002 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD
    EN IEC 62969-1:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
    17/30350017 DC : 0 BS EN 62228-1 - INTEGRATED CIRCUITS - EMC EVALUATION OF TRANSCEIVERS - PART 1: GENERAL CONDITIONS AND DEFINITIONS
    CSA CEI/IEC 61000.4.7 : 2003(R2007) ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-7: TESTING AND MEASUREMENT TECHNIQUES - GENERAL GUIDE ON HARMONICS AND INTERHARMONICS MEASUREMENTS AND INSTRUMENTATION, FOR POWER SUPPLY SYSTEMS AND EQUIPMENT CONNECTED THERETO
    14/30310470 DC : 0 BS EN 62228-2 - INTEGRATED CIRCUITS - EMC EVALUATION OF LIN TRANSCEIVERS
    CEI EN 61967-8 : 2012 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
    BS EN 61967-2:2005 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
    BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
    IEC TS 62228:2007 Integrated circuits - EMC evaluation of CAN transceivers
    I.S. EN 61967-5:2003 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 5: MEASUREMENT OF CONDUCTED EMISSIONS - WORKBENCH FARADAY CAGE METHOD
    I.S. EN 62433-3:2017 EMC IC MODELLING - PART 3: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - RADIATED EMISSIONS MODELLING (ICEM-RE)
    IEC TS 62239-1:2015 Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
    IEC 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
    IEC 62969-1:2017 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors
    PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
    DD IEC/TS 62239:2003 Process management for avionics. Preparation of an electronic components management plan
    BS EN 61967-5:2003 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method
    BS EN 62433-3:2017 EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
    07/30163156 DC : 0 BS EN 62433-2 - MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - ICEM-CE, ICEM CONDUCTED EMISSION MODEL
    12/30268333 DC : 0 BS EN 62132-1 - INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY - PART 1: GENERAL CONDITIONS AND DEFINITIONS
    IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
    IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
    IEEE 802.3-2012 IEEE Standard for Ethernet
    NF EN 61967-4 : 2002 AMD 1 2006 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ - 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSION - 1 OHM/150 OHM DIRECT COUPLING METHOD
    IEC 62228-1:2018 Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
    EN 61967-6:2002/A1:2008 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    17/30365636 DC : 0 BS EN 62239-1 ED.1.0 - PROCESS MANAGEMENT FOR AVIONICS - MANAGEMENT PLAN - PART 1: PREPARATION AND MAINTENANCE OF AN ELECTRONIC COMPONENTS MANAGEMENT PLAN
    PD IEC/TS 62239-1:2015 Process management for avionics. Management plan Preparation and maintenance of an electronic components management plan
    IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
    IEC 62433-3:2017 EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)
    IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
    IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
    EN 61967-8 : 2011 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS - PART 8: MEASUREMENT OF RADIATED EMISSIONS - IC STRIPLINE METHOD
    I.S. EN 61967-6:2003 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
    16/30336986 DC : 0 BS EN 62969-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 1: GENERAL REQUIREMENTS OF POWER INTERFACE FOR AUTOMOTIVE VEHICLE SENSORS
    DD IEC/TS 62228:2007 Integrated circuits. EMC evaluation of CAN transceivers
    I.S. EN 61967-2:2005 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
    IEC TR 61967-4-1:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
    IEC TR 62014-3:2002 Electronic design automation libraries - Part 3: Models of integrated circuits for EMI behavioural simulation
    EN 61967-4 : 2002 COR 2017 INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 4: MEASUREMENT OF CONDUCTED EMISSIONS - 1 OHM/150 OHM DIRECT COUPLING METHOD (IEC 61967-4:2002/COR1:2017)
    IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
    IEC 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
    EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
    EN 62228-2:2017 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
    IEC 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
    IEC 61000-4-6 : 4.0 ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-6: TESTING AND MEASUREMENT TECHNIQUES - IMMUNITY TO CONDUCTED DISTURBANCES, INDUCED BY RADIO-FREQUENCY FIELDS
    IEC 61000-4-6:2013 Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
    CISPR 25:2016 Vehicles, boats and internal combustion engines - Radio disturbance characteristics - Limits and methods of measurement for the protection of on-board receivers
    IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
    IEEE C63.2-2009 American National Standard for Electromagnetic Noise and Field Strength Instrumentation, 10 Hz to 40 GHz Specifications
    IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test
    IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
    CISPR 16-1:1999+AMD1:2002 CSV Specification for radio disturbance and immunity measuring apparatus and methods - Part 1: Radio disturbance and immunity measuring apparatus
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