AS C366.4-1978
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Acceptance and reliability
PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users
26-10-2017
English
01-01-1978
Note - due to the age of this archived document, available information is limited therfore this record is incomplete. For further details, please phone our Customer Service Centre on 131 242 (Intl +61 2 8206 6010) or email sales@saiglobal.com.
This part of AS C366 specifies conditions for electrical tests, for different temperature conditions and for different durations. Failure-defining characteristics and failure criteria are specified for each device category. This permits the comparison of data relative to acceptance testing and reliability testing of semiconductor devices and integrated circuits.
Committee |
TE-012
|
DocumentType |
Standard
|
ISBN |
0 7262 1541 4
|
Pages |
13
|
PublisherName |
Standards Australia
|
Status |
Superseded
|
SupersededBy |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.