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AS C366.4-1978

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Acceptance and reliability

Available format(s)

PDF 1 User , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

26-10-2017

Language(s)

English

Published date

01-01-1978

Note - due to the age of this archived document, available information is limited therfore this record is incomplete. For further details, please phone our Customer Service Centre on 131 242 (Intl +61 2 8206 6010) or email sales@saiglobal.com.

This part of AS C366 specifies conditions for electrical tests, for different temperature conditions and for different durations. Failure-defining characteristics and failure criteria are specified for each device category. This permits the comparison of data relative to acceptance testing and reliability testing of semiconductor devices and integrated circuits.

Committee
TE-012
DocumentType
Standard
ISBN
0 7262 1541 4
Pages
13
PublisherName
Standards Australia
Status
Superseded
SupersededBy

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