ASTM E 1161 : 1995
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
11-11-2014
01-01-1995
| Committee |
E 07
|
| DocumentType |
Test Method
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
1.1 This test method provides a standard procedure for nondestructive radiographic examination of semiconductor devices, electronic components, and the materials used for construction of these items. This test method covers the radiographic testing of these items for possible defective conditions such as extraneous material within the sealed case, improper internal connections, voids in materials used for element mounting, or the sealing glass, or physical damage.
1.2 The quality level and acceptance criteria for the specimens being tested shall be specified in the detail drawing, purchase order or contract.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ASTM E 431 : 1996 : R2016 | Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices |
| ASTM E 2033 : 2017 | Standard Practice for Radiographic Examination Using Computed Radiography (Photostimulable Luminescence Method) |
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