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  • ASTM E 431 : 1996 : R2016

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

    Available format(s):  Hardcopy, PDF

    Superseded date:  18-10-2022

    Language(s):  English

    Published date:  22-06-2016

    Publisher:  American Society for Testing and Materials

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    Abstract - (Show below) - (Hide below)

    CONTAINED IN VOL. 03.03, 2017 Gives illustrations of radiographs of semiconductors and related devices.

    Scope - (Show below) - (Hide below)

    1.1This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.

    1.2This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

    General Product Information - (Show below) - (Hide below)

    Committee E 07
    Document Type Guide
    Product Note Reconfirmed 2016
    Publisher American Society for Testing and Materials
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    ASTM E 543 : 2021 Standard Specification for Agencies Performing Nondestructive Testing
    ASTM E 1161 : 2021 Standard Practice for Radiographic Examination of Semiconductors and Electronic Components

    Standards Referencing This Book - (Show below) - (Hide below)

    ASTM E 1316 : 2022 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2011 : REV B Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2015 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 801 : 2016 : REDLINE Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices
    ASTM E 1255 : 2009 Standard Practice for Radioscopy
    ASTM E 1316 : 2009 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2008 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2010 : REV C Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2020 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2017 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2013 : REV C Standard Terminology for Nondestructive Examinations
    ASTM E 1161 : 1995 Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
    ASTM E 1316 : 2000 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1255 : 1996 Standard Practice for Radioscopy
    ASTM E 1316 : 2019 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2014 Standard Terminology for Nondestructive Examinations
    ASTM E 801 : 2016 Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices
    ASTM E 1316 : 2013 : REV B Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2018 Standard Terminology for Nondestructive Examinations
    ASTM E 801 : 1991 : R1995 : EDT 1 Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices
    ASTM E 1316 : 2011 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2007 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2015 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2019 : REV B Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2021 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2013 : REV D Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2000 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2019 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2001 Standard Terminology for Nondestructive Examinations
    ASTM E 1161 : 2009 : R2014 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
    ASTM E 1316 : 2003 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2018 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2006 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2016 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2021 : REV D Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2002 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1161 : 2021 Standard Practice for Radiographic Examination of Semiconductors and Electronic Components
    ASTM E 1316 : 2014 : EDT 1 Standard Terminology for Nondestructive Examinations
    ASTM E 1255 : 2016 : REDLINE Standard Practice for Radioscopy
    ASTM E 1316 : 2010 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2022 Standard Terminology for Nondestructive Examinations
    ASTM E 1161 : 2009 Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
    ASTM E 1316 : 2013 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2021 : REV B Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2017 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2016 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1161 : 2003 Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
    ASTM E 1316 : 2009 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2002 Standard Terminology for Nondestructive Examinations
    ASTM E 801 : 2021 Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices
    ASTM E 1316 : 2004 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2007 : REV C Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2010 : REV B Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2013 : REV A Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2021 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2007 : REV B Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2005 Standard Terminology for Nondestructive Testing
    ASTM E 1316 : 2004 Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2021 : REV C Standard Terminology for Nondestructive Examinations
    ASTM E 1316 : 2007 Standard Terminology for Nondestructive Examinations
    ASTM E 1255 : 2016 Standard Practice for Radioscopy
    ASTM E 1316 : 2012 Standard Terminology for Nondestructive Examinations
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