• Shopping Cart
    There are no items in your cart

ASTM E 1217 : 2011 : REDLINE

Current

Current

The latest, up-to-date edition.

Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers

Available format(s)

PDF

Language(s)

English

Published date

01-11-2011

€67.30
Excluding VAT

CONTAINED IN VOL. 03.06, 2015 Defines methods for determining the specimen area contributing to the detected signal in Auger electron spectrometers and some types of X-ray photoelectron spectrometers (spectrometer analysis area) when this area is defined by the electron collection lens and aperture system of the electron energy analyzer.

Committee
E 42
DocumentType
Redline
Pages
10
PublisherName
American Society for Testing and Materials
Status
Current

1.1 This practice describes methods for determining the specimen area contributing to the detected signal in Auger electron spectrometers and some types of X-ray photoelectron spectrometers (spectrometer analysis area) when this area is defined by the electron collection lens and aperture system of the electron energy analyzer. The practice is applicable only to those X-ray photoelectron spectrometers in which the specimen area excited by the incident X-ray beam is larger than the specimen area viewed by the analyzer, in which the photoelectrons travel in a field-free region from the specimen to the analyzer entrance. Some of the methods described here require an auxiliary electron gun mounted to produce an electron beam of variable energy on the specimen (electron-gun method). Other experiments require a sample with a sharp edge, such as a wafer covered with a uniform clean layer (for example, gold (Au) or silver (Ag)) and cleaved to obtain a long side (sharp-edge method).

1.2 This practice is recommended as a useful means for determining the specimen area viewed by the analyzer for different conditions of spectrometer operation, for verifying adequate specimen and beam alignment, and for characterizing the imaging properties of the electron energy analyzer.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ISO/TR 19319:2013 Surface chemical analysis Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
ASTM E 1016 : 2007 : R2012 : EDT 1 Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
ASTM E 2735 : 2014 : REDLINE Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
PD ISO/TR 19319:2013 Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
ASTM E 1016 : 2007 Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers

ASTM E 673 : 2003 Standard Terminology Relating to Surface Analysis (Withdrawn 2012)
ISO 18115:2001 Surface chemical analysis Vocabulary
ISO 18516:2006 Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Determination of lateral resolution

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.