ASTM E 1249 : 2010
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Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
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ASTM E 1297 : 2008 : R2013
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Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
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ASTM E 2450 : 2005
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Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
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ASTM F 1190 : 2018
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Standard Guide for Neutron Irradiation of Unbiased Electronic Components
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ASTM F 1190 : 1993
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Standard Guide for Neutron Irradiation of Unbiased Electronic Components
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ASTM F 1190 : 1999
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Standard Guide for Neutron Irradiation of Unbiased Electronic Components
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ASTM E 1855 : 2005
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 2005:2010
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Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
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ASTM E 2005 : 2010 : R2015
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Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
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ASTM E 1855 : 2004
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 1855 : 2004 : EDT 1
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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 2005 : 2005
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Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
|
ASTM E 1855 : 2005 : EDT 1
|
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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ASTM E 1018 : 2009 : R2013 : EDT 1
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Standard Guide for Application of ASTM Evaluated Cross Section Data File
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ASTM E 2005 : 1999
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Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
|
ASTM E 1855 : 2015
|
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
|
ASTM E 2450 : 2011
|
Standard Practice for Application of CaF<sub>2</sub>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
|
ASTM E 1249 : 2000 : R2005
|
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
|
ASTM E 2005 : 2005 : EDT 1
|
Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
|
ASTM E 1297 : 1996
|
Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
|
ASTM E 1249 : 2015
|
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
|
ASTM E 1018 : 2009
|
Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB)
|
ASTM E 1250 : 2010
|
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
|
ASTM E 1855 : 2010
|
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
|
ASTM E 1297 : 2008
|
Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
|
ASTM E 1250 : 1988 : R2000
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Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
|
ASTM E 1250 : 1988 : R2005
|
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
|
ASTM E 1018 : 2009 : R2013
|
Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB)
|
ASTM E 1297 : 2018
|
Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
|
ASTM E 1018 : 2001
|
Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB)
|
ASTM E 1297 : 2002
|
Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
|
ASTM E 2450 : 2016
|
Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
|
ASTM E 1855 : 1996
|
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
|
ASTM E 1249 : 2000
|
Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
|
ASTM E 1018 : 1995
|
Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB)
|
ASTM E 1250 : 2015
|
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
|
ASTM E 2450 : 2006
|
Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
|
ASTM F 1190 : 2011
|
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
|