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ASTM E 1854 : 2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

Available format(s)

Hardcopy , PDF

Superseded date

21-10-2019

Superseded by

ASTM E 1854 : 2019

Language(s)

English

Published date

01-06-2013

€74.48
Excluding VAT

Committee
E 10
DocumentType
Standard Practice
Pages
13
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

1.1This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing.

1.2Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor sources, accelerator-based neutron sources, such as 14-MeV DT sources, and 252Cf sources. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered to recognize, minimize or eliminate these problems. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole. Electrical measurements are addressed in other standards, such as Guide F980. Additional information on conducting irradiations can be found in Practices E798 and F1190. This practice also may be of use to test sponsors (organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments).

1.3Methods for the evaluation and control of undesired contributions to damage are discussed in this practice. References to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels for electronics systems are beyond the scope of this practice; however, the process for determining the 1-MeV equivalent displacement specifications from operational environment neutron spectra should employ the methods and parameters described herein. Some important considerations and recommendations are addressed in Appendix X1 (Nonmandatory information).

1.4The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.5This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM E 1855 : 2015 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM F 980 : 2016 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
ASTM E 2450 : 2016 Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
ASTM F 1190 : 2018 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

ASTM E 1249 : 2010 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 1297 : 2008 : R2013 Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
ASTM E 2450 : 2005 Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
ASTM F 1190 : 2018 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
ASTM F 1190 : 1993 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
ASTM F 1190 : 1999 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
ASTM E 1855 : 2005 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 2005:2010 Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
ASTM E 2005 : 2010 : R2015 Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
ASTM E 1855 : 2004 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1855 : 2004 : EDT 1 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 2005 : 2005 Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
ASTM E 1855 : 2005 : EDT 1 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1018 : 2009 : R2013 : EDT 1 Standard Guide for Application of ASTM Evaluated Cross Section Data File
ASTM E 2005 : 1999 Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
ASTM E 1855 : 2015 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 2450 : 2011 Standard Practice for Application of CaF<sub>2</sub>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
ASTM E 1249 : 2000 : R2005 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 2005 : 2005 : EDT 1 Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields
ASTM E 1297 : 1996 Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
ASTM E 1249 : 2015 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 1018 : 2009 Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB)
ASTM E 1250 : 2010 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
ASTM E 1855 : 2010 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1297 : 2008 Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
ASTM E 1250 : 1988 : R2000 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
ASTM E 1250 : 1988 : R2005 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
ASTM E 1018 : 2009 : R2013 Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB)
ASTM E 1297 : 2018 Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
ASTM E 1018 : 2001 Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB)
ASTM E 1297 : 2002 Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium
ASTM E 2450 : 2016 Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
ASTM E 1855 : 1996 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E 1249 : 2000 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 1018 : 1995 Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB)
ASTM E 1250 : 2015 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
ASTM E 2450 : 2006 Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
ASTM F 1190 : 2011 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

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