ASTM E 1854 : 2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Hardcopy , PDF
21-10-2019
English
01-06-2013
Committee |
E 10
|
DocumentType |
Standard Practice
|
Pages |
13
|
PublisherName |
American Society for Testing and Materials
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
1.1This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing.
1.2Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor sources, accelerator-based neutron sources, such as 14-MeV DT sources, and 252Cf sources. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered to recognize, minimize or eliminate these problems. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole. Electrical measurements are addressed in other standards, such as Guide F980. Additional information on conducting irradiations can be found in Practices E798 and F1190. This practice also may be of use to test sponsors (organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments).
1.3Methods for the evaluation and control of undesired contributions to damage are discussed in this practice. References to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels for electronics systems are beyond the scope of this practice; however, the process for determining the 1-MeV equivalent displacement specifications from operational environment neutron spectra should employ the methods and parameters described herein. Some important considerations and recommendations are addressed in Appendix X1 (Nonmandatory information).
ASTM E 1855 : 2015 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM F 980 : 2016 | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices |
ASTM E 2450 : 2016 | Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments |
ASTM F 1190 : 2018 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
ASTM E 1249 : 2010 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
ASTM E 1297 : 2008 : R2013 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium |
ASTM E 2450 : 2005 | Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments |
ASTM F 1190 : 2018 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
ASTM F 1190 : 1993 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
ASTM F 1190 : 1999 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
ASTM E 1855 : 2005 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM E 2005:2010 | Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields |
ASTM E 2005 : 2010 : R2015 | Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields |
ASTM E 1855 : 2004 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM E 1855 : 2004 : EDT 1 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM E 2005 : 2005 | Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields |
ASTM E 1855 : 2005 : EDT 1 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM E 1018 : 2009 : R2013 : EDT 1 | Standard Guide for Application of ASTM Evaluated Cross Section Data File |
ASTM E 2005 : 1999 | Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields |
ASTM E 1855 : 2015 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM E 2450 : 2011 | Standard Practice for Application of CaF<sub>2</sub>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments |
ASTM E 1249 : 2000 : R2005 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
ASTM E 2005 : 2005 : EDT 1 | Standard Guide for Benchmark Testing of Reactor Dosimetry in Standard and Reference Neutron Fields |
ASTM E 1297 : 1996 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium |
ASTM E 1249 : 2015 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
ASTM E 1018 : 2009 | Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB) |
ASTM E 1250 : 2010 | Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices |
ASTM E 1855 : 2010 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM E 1297 : 2008 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium |
ASTM E 1250 : 1988 : R2000 | Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices |
ASTM E 1250 : 1988 : R2005 | Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices |
ASTM E 1018 : 2009 : R2013 | Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E706 (IIB) |
ASTM E 1297 : 2018 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium |
ASTM E 1018 : 2001 | Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB) |
ASTM E 1297 : 2002 | Standard Test Method for Measuring Fast-Neutron Reaction Rates by Radioactivation of Niobium |
ASTM E 2450 : 2016 | Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments |
ASTM E 1855 : 1996 | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
ASTM E 1249 : 2000 | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
ASTM E 1018 : 1995 | Standard Guide for Application of ASTM Evaluated Cross Section Data File, Matrix E 706 (IIB) |
ASTM E 1250 : 2015 | Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices |
ASTM E 2450 : 2006 | Standard Practice for Application of CaF<inf>2</inf>(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments |
ASTM F 1190 : 2011 | Standard Guide for Neutron Irradiation of Unbiased Electronic Components |
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