ASTM E 2039 : 2004

CONTAINED IN VOL. 14.02, 2009 Specifies the gathering and reporting of dynamic dielectric data.

1.1 This test method describes the gathering and reporting of dynamic dielectric data. It incorporates laboratory test method for determining dynamic dielectric properties of specimens subjected to an oscillatory electric field using a variety of dielectric sensor/cell configurations on a variety of instruments called dielectric, microdielectric, DETA (DiElectric Thermal Analysis), or DEA (DiElectric Analysis) analyzers.

1.2 This test method determines permittivity, loss factor, ionic conductivity (or resistivity), dipole relaxation times, and transition temperatures, and is intended for materials that have a relative permittivity in the range of 1 to 10⁵; loss factors in the range of 0 to 10⁸; and, conductivities in the range 10 ¹⁶to 10¹⁰S/cm.

1.3 The test method is primarily useful when conducted over a range of temperatures for nonreactive systems (160C to degradation) and over time (and temperature) for reactive systems and is valid for frequencies ranging from 1 mHz to 100 kHz.

1.4 Apparent discrepancies may arise in results obtained under differing experimental conditions. Without changing the observed data, completely reporting the conditions (as described in this test method) under which the data were obtained, in full, will enable apparent differences observed in another study to be reconciled.

1.5 SI units are the standard.

This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific precautionary statements are given in Section 10.