ASTM E 2446 : 2016
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Standard Practice for Manufacturing Characterization of Computed Radiography Systems
Hardcopy , PDF
20-06-2024
English
24-06-2016
This practice describes the manufacturing characterization of computed radiography (CR) systems, consisting of a particular phosphor imaging plate (IP), scanner, software, and an image display monitor, in combination with specified metal screens for industrial radiography.
Committee |
E 07
|
DocumentType |
Standard Practice
|
Pages |
14
|
PublisherName |
American Society for Testing and Materials
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
1.1This practice describes the manufacturing characterization of computed radiography (CR) systems, consisting of a particular phosphor imaging plate (IP), scanner, software, and an image display monitor, in combination with specified metal screens for industrial radiography.
1.2The practice defines system tests to be used to characterize the systems of different suppliers and make them comparable for users.
1.3This practice is intended for use by manufacturers of CR systems or certification agencies to provide quantitative results of CR system characteristics for nondestructive testing (NDT) user or purchaser consumption. Some of these tests require specialized test phantoms to ensure consistency of results among suppliers or manufacturers. These tests are not intended for users to complete, nor are they intended for long term stability tracking and lifetime measurements. However, they may be used for this purpose, if so desired.
1.4The CR system performance is described by the basic spatial resolution, contrast, signal and noise parameters, and the equivalent penetrameter sensitivity (EPS). Some of these parameters are used to compare with DDA characterization and film characterization data (see Practice E2597 and Test Method E1815).
Note 1:For film system characterization, the signal is represented by the optical density of 2 (above fog and base) and the noise as granularity. The signal-to-noise ratio is normalized by the aperture (similar to the basic spatial resolution) of the system and is part of characterization. This normalization is given by the scanning circular aperture of 100 µm of the micro-photometer, which is defined in Test Method E1815 for film system characterization.
1.5The measurement of CR systems in this practice is restricted to a selected radiation quality to simplify the procedure. The properties of CR systems will change with radiation energy but not the ranking of CR system performance. Users of this practice may carry out the tests at different or additional radiation qualities (X-ray or gamma ray) if required.
1.6The values stated in SI are to be regarded as the standard.
1.7This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations prior to use.
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ASTM E 1316 : 2008 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2010 : REV C | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2020 : REV A | Standard Terminology for Nondestructive Examinations |
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ASTM E 1316 : 2013 : REV C | Standard Terminology for Nondestructive Examinations |
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ASTM E 1316 : 2000 : REV A | Standard Terminology for Nondestructive Examinations |
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ASTM E 1316 : 2019 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1165 : 2012 : R2017 | Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging |
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ASTM E 1316 : 2013 : REV B | Standard Terminology for Nondestructive Examinations |
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ASTM E 1316 : 2011 : REV A | Standard Terminology for Nondestructive Examinations |
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ASTM E 1316 : 2007 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2015 | Standard Terminology for Nondestructive Examinations |
ASTM E 1165:2012 | Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging |
ASTM E 1316 : 2019 : REV B | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2021 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2013 : REV D | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2000 | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2019 | Standard Terminology for Nondestructive Examinations |
ASTM E 2002 : 1998 | Standard Practice for Determining Total Image Unsharpness in Radiology |
ASTM E 2033 : 1999 | Standard Practice for Computed Radiology (Photostimulable Luminescence Method) |
ASTM E 1316 : 2001 | Standard Terminology for Nondestructive Examinations |
ASTM E 1165 : 1992 : R1996 : EDT 1 | Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging |
ASTM E 1316 : 2003 | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2018 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2006 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2016 | Standard Terminology for Nondestructive Examinations |
ASTM E 2002 : 1998 : R2003 : EDT 1 | Standard Practice for Determining Total Image Unsharpness in Radiology |
ASTM E 2007 : 2000 | Standard Guide for Computed Radiology (Photostimulable Luminescence (PSL) Method) |
ASTM E 1815 : 2008 : R2013 : EDT 1 | Standard Test Method for Classification of Film Systems for Industrial Radiography |
ASTM E 2903 : 2018 | Standard Test Method for Measurement of the Effective Focal Spot Size of Mini and Micro Focus X-ray Tubes |
ASTM E 2002 : 1998 : R2009 | Standard Practice for Determining Total Image Unsharpness in Radiology |
ASTM E 1316 : 2021 : REV D | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2002 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2014 : EDT 1 | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2010 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2022 | Standard Terminology for Nondestructive Examinations |
ASTM E 1165 : 2020 | Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging |
ASTM E 1316 : 2013 | Standard Terminology for Nondestructive Examinations |
ASTM E 2007 : 2008 | Standard Guide for Computed Radiography |
ASTM E 1316 : 2021 : REV B | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2017 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 2903 : 2013 | Standard Test Method for Measurement of the Effective Focal Spot Size of Mini and Micro Focus X-ray Tubes |
ASTM E 1316 : 2016 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1815 : 2008 | Standard Test Method for Classification of Film Systems for Industrial Radiography |
ASTM E 2445 : 2005 : R2010 | Standard Practice for Qualification and Long-Term Stability of Computed Radiology Systems |
ASTM E 1316 : 2009 | Standard Terminology for Nondestructive Examinations |
ASTM E 2597 : 2007 : EDT 1 | Standard Practice for Manufacturing Characterization of Digital Detector Arrays |
ASTM E 1316 : 2002 | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2004 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 2007 : 2010 : R2016 | Standard Guide for Computed Radiography |
ASTM E 1316 : 2007 : REV C | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2010 : REV B | Standard Terminology for Nondestructive Examinations |
ASTM E 1316 : 2013 : REV A | Standard Terminology for Nondestructive Examinations |
ASTM E 1815 : 2006 | Standard Test Method for Classification of Film Systems for Industrial Radiography |
ASTM E 2002 : 2015 | Standard Practice for Determining Total Image Unsharpness and Basic Spatial Resolution in Radiography and Radioscopy |
ASTM E 1165 : 1992 : R2002 | Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging |
ASTM E 1316 : 2021 | Standard Terminology for Nondestructive Examinations |
ASTM E 2033 : 1999 : R2006 | Standard Practice for Computed Radiology (Photostimulable Luminescence Method) |
ASTM E 1316 : 2007 : REV B | Standard Terminology for Nondestructive Examinations |
ASTM E 1165 : 2004 : R2010 | Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging |
ASTM E 1316 : 2005 | Standard Terminology for Nondestructive Testing |
ASTM E 1316 : 2004 | Standard Terminology for Nondestructive Examinations |
ASTM E 1165 : 2004 | Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging |
ASTM E 1316 : 2021 : REV C | Standard Terminology for Nondestructive Examinations |
ASTM E 2445 : 2005 | Standard Practice for Qualification and Long-Term Stability of Computed Radiology Systems |
ASTM E 1316 : 2007 | Standard Terminology for Nondestructive Examinations |
ASTM E 1815 : 2018 : R2023 | Standard Test Method for Classification of Film Systems for Industrial Radiography |
ASTM E 1316 : 2023 | Standard Terminology for Nondestructive Examinations |
ASTM E 2597 : 2007 | Standard Practice for Manufacturing Characterization of Digital Detector Arrays |
ASTM E 1316 : 2012 | Standard Terminology for Nondestructive Examinations |
ASTM E 2007 : 2000 : R2006 | Standard Guide for Computed Radiology (Photostimulable Luminescence (PSL) Method) |
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