ASTM E 2627 : 2013 : REDLINE
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
11-11-2014
English
01-11-2013
CONTAINED IN VOL. 03.01, 2016 Defines grain size from measurements of grain areas from automated electron backscatter diffraction (EBSD) scans of polycrystalline materials.
Committee |
E 04
|
DocumentType |
Redline
|
Pages |
6
|
PublisherName |
American Society for Testing and Materials
|
Status |
Superseded
|
1.1This practice is used to determine grain size from measurements of grain areas from automated electron backscatter diffraction (EBSD) scans of polycrystalline materials.
1.2The intent of this practice is to standardize operation of an automated EBSD instrument to measure ASTM G directly from crystal orientation. The guidelines and caveats of E112 apply here, but the focus of this standard is on EBSD practice.
1.3This practice is only applicable to fully recrystallized materials.
1.4This practice is applicable to any crystalline material which produces EBSD patterns of sufficient quality that a high percentage of the patterns can be reliably indexed using automated indexing software.
1.5The practice is applicable to any type of grain structure or grain size distribution.
1.6The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.7This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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ASTM E 7 : 2017 : REDLINE | Standard Terminology Relating to Metallography |
ASTM E 1382 : 1997 | Standard Test Methods for Determining Average Grain Size Using Semiautomatic and Automatic Image Analysis |
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